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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Bruker Introduces the Alloy Guide App for Mobile Devices
- Bruker Announces $1.3 Million Contract with ThyssenKrupp Stainless USA
- Bruker and Symphony Environmental Sign Agreement on X-Ray Fluorescence (XRF) Technology Enabling Identification of the Components of Plastic
- Customer Service testimonial from Dale Kronkright, Head of Conservation at Georgia O'Keeffe Museum
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
Tracer III-V+ / III-SD
There are many reasons why the Tracer family has become the preferred instrument for leading conservation scientists around the world. It combines the power and flexibility you would expect from a bench-top instrument with the convenience of a handheld – thanks to some pioneering, user-oriented innovations. These include the same vacuum technology that we originally developed in partnership with NASA for the space shuttle program. The instrument also comes with powerful laptop-based analytical software, live-time spectral display, and customizable filters and secondary targets, designed to optimize your analysis no matter what the application.
These analyzers allow complete user control of the excitation conditions - current, voltage and user selected filter for optimization of measurement conditions for investigation of your objects. The Tracer III-SD incorporates the proprietary X-Flash® Silicon Drift Detector (SDD) which provides high speed data acquisition, better resolution than the traditional SiPIN detector and light element sensitivity. When the Tracer III-SD is operated with the optional vacuum system the ultimate light element sensitivity can be achieved.
In addition to the basic instrument the system is supplied with: 1) powerful lap-top based analytical software which provides live spectral display and complete peak identification; 2) a tripod mount which allows precise three dimensional positioning of the analyzer and 3) unmatched application training and support.
The benefits at a glance
- The capabilities of a bench-top instrument, with the convenience of a handheld
- Powerful laptop-based analytical software
- Customizable filters and secondary targets to optimize analysis
- Live-time spectral display
- Vacuum technology developed in partnership with NASA for the space shuttle program
- Standard package includes 360o tripod
- Proprietary X-FLASH® SDD technology (Tracer III-SD and IV-SD only)
- Unmatched training and support
Other Product Suggestions
S1 TURBOSD
- The first ever SDD-based handheld analyzer
- Superior count rates and resolution (compared to previous generation SiPin instruments)
- Five times faster than previous generations
- Lower detection limits
- Grade library covers low alloy steel, tool steel, stainless steel, nickel alloys, cobalt alloys, copper alloys, aluminum alloys, titanium alloys, zirconium alloys and tungsten alloys
- Easy analysis of light elements, such as magnesium, aluminum and silicon, without the need for vacuum or helium atmosphere (S1 TURBOSD LE only)
S1 TURBOSDR
- For Restricted Materials Analysis
- The first ever SDD-based handheld analyzer
- Superior count rates and resolution (compared to previous generation SiPin instruments)
- Lower detection limits
- Rh based X-ray tube
S1 SORTER
- Best value in the market
- Performance equal to any available system using a SiPIN detector
- Covers all common classes of metal
More Information
System Accessories for the Tracer III-V+ Handheld XRF Analyzer
PBS History Detectives: Civil War Cannon analyzed with Tracer (10:30 - 12:35)






