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- At EPDIC 12 Dr. Hugo Rietveld was granted the EPDIC Award for Distinguished Powder Diffractionists
- D2 PHASER with XFlash® Detector - Combined XRD, EDXRD, and XRF analysis
- Bruker Announces Agreement to Acquire Veeco's
- Prof. David C. Joy wins 2010 Duncumb Award for Excellence in Microanalysis
- Bruker Receives Contract from National Institute of Standards and Technology (NIST) for N8 TITANOS
- 4th International SAXS/GISAXS Workshop (PDF)
Sep 09-11, Leoben, Austria - Navigated Atomic Force Microscopy - N8 NEOS
Sep 15, Free Webinar - 17th Bruker Users‘ Group Meetings 2010 - Single Crystal X-ray Diffraction
Sep 19-22, Karlsruhe, Germany - Good Diffraction Practice III - Powder XRD Instrumentation and Data Quality
Sep 30, Free Webinar - COM2010 - Conference of Metallurgists
Oct 03-06, Vancouver, British Columbia, Canada
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News
- April 26, 2010
- Bruker Receives Contract from National Institute of Standards and Technology (NIST) for N8 TITANOS
N8 TITANOS - Large Sample Atomic Force Microscope (AFM) System
- March 31, 2010
- Lab Report XRD 61 - X-Ray Metrology Study
of the SiGe Epitaxial Layer on a Patterned Wafer
- March 29, 2010
- Customer Testimonial - APEX DUO
Read testimonial by Dr. Heinemann (Friedrich-Alexander-University, Erlangen-Nuremberg, Germany): "In 1987 the Institute of Inorganic Chemistry of the Friedrich-Alexander University Erlangen-Nuremberg established single crystal X-ray structure determination as a routine method using a NICOLET R3m/V...
- March 26, 2010
- SMART X2S Brochure - Crystallography Solutions
Chemical Structures at the Touch of a Button – SMART X2S
- March 24, 2010
- Lab Report SC-XRD 44 - X8 PROTEUM: A complete 2.0 Å Lysozyme data set in 30 seconds
The ability to quickly obtain diffraction information is extremely useful in structural biology labs. Whether characterizing samples for an important synchrotron trip or conducting high-throughput studies for drug discovery, reducing experimental time can increase productivity and ultimately...
- March 23, 2010
- Bruker AXS Introduces the New D8 DISCOVER™
An Advanced X-ray Diffraction System for Materials Research Applications Including 2-Dimensional Diffraction XRD²
- March 23, 2010
- Bruker Nano Introduces the New N8 NEOS
For Optically Navigated Atomic Force Microscopy (AFM) with Best-in-Class Atomic Resolving Power
- March 23, 2010
- Bruker AXS Unveils Enhanced S2 RANGER EDXRF Spectrometer
S2 RANGER EDXRF Spectrometer with Best-in-Class Light Element Analysis for the Food, Minerals & Mining and Cement Industries
- March 18, 2010
- S1 SORTER testimonial from TP Consulting Services
Terry Pontius of TP Consulting Services recently used the S1 SORTER for one of his consulting projects. Upon completion of the job, he sent us this note on his experience with the S1 SORTER:
"TP Consulting Services recently completed a Positive Material Identification Project involving mixed...
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