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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Application Report XRD 13 - D2 PHASER Desktop XRD
- 9th TOPAS Users´ Meeting in Bad Herrenalb, Germany
- Bruker Expands in China with Opening of Second Major Applications, Training and Service Center in Shanghai
- Bruker receives Honorable Mention for Seattle Business magazine’s 2011 Washington Manufacturing Award
Upcoming Events
- Pittcon 2012
Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
D8 DISCOVER with DAVINCI design – Advanced X-ray Diffraction System for Materials Research Applications
- D8 DISCOVER with DAVINCI design
The D8 DISCOVER with DAVINCI design increases ease-of-use with real-time component detection, plug-and-play functionality and fully integrated 2-dimensional XRD2 capabilities. These unique features allow the user to easily switch between all materials research X-ray diffraction applications, including reflectometry, high-resolution diffraction, grazing incidence diffraction (IP-GID), small angle X-ray scattering (SAXS), as well as residual stress and texture investigations.
Two-dimensional VǺNTEC-500 detector
In particular, for micro-diffraction and ultra-fast reciprocal space mapping, the new two-dimensional VǺNTEC-500 detector with 2048x2048 channels at 144 cm2 active area provides highest sensitivity for detecting even the weakest diffraction signals in short measurement times. The D8 DISCOVER with DAVINCI design is designed to meet all the latest X-ray safety regulatory requirements, providing scientists peace-of-mind.
Snap-lock X-ray optics with tool-free switching of the diffraction geometry
An integral part of the D8 DISCOVER with DAVINCI design is the new DIFFRAC.SUITE™ software with consistently implemented automation functionality. An X-ray optics module, a detector, or any accessory mounted onto the instrument registers itself in real-time with its relevant parameters and analytical capabilities, including powerful detection of possible component conflicts. The factory-aligned, snap-lock X-ray optics provide true ‘plug-and-play’ functionality, including automatic and tool-free switching of the diffraction geometry with minimal user intervention. The DIFFRAC.SUITE offers intuitive operation based on a graphical user interface that can be customized to match the operator’s requirements.
