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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Bruker Announces $1.3 Million Contract with ThyssenKrupp Stainless USA
- Lab Report SC-XRD 46 - Higher Dimensional Crystallography
- Lab Report XRF 103 - S2 RANGER with XFlash LE and GEO-QUANT M
- Bruker Announces Advanced G4 ICARUS Combustion Gas Analyzer for Metal Foundry and Heat Treatment Applications
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Mar 11-15, Orlando, Florida, USA - SEMICON China 2012
Mar 20-22, Shanghai, China - ARAB LAB 2012
Mar 26-29, Dubai, UAE - DPG Spring Meeting
Mar 27-29, Berlin, Germany - 2012 NUANCE-Bruker International Symposium
Apr 05, Evanston, IL, USA - ANALYTICA 2012
Apr 17-20, Munich, Germany
LAB Tools
- D8 DISCOVER
Various X-ray methods are available for obtaining crucial parameters in the nanodomain. One can think of thickness, density, roughness, chemical composition and orientation of thin layers, lattice constants and mismatches, strain and relaxation of epitaxial films and porosity and crystallite sizes in thin films.
The D8 DISCOVER offers optimized solutions for the analysis of the smallest features using X-ray reflectivity (XRR), high resolution X-ray diffraction (HRXRD), micro diffraction (µXRD), grazing incidence diffraction (GID), grazing incidence small angle X-ray scattering (GISAXS) and micro X-ray fluorescence (µXRF).
