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- Bruker Acquires Hecus MICROcaliX(R) Product Line to Expand Product Portfolio for Small Angle X-ray Scattering (SAXS)
- Bruker Announces $1.3 Million Contract with ThyssenKrupp Stainless USA
- Lab Report SC-XRD 46 - Higher Dimensional Crystallography
- Lab Report XRF 103 - S2 RANGER with XFlash LE and GEO-QUANT M
- Bruker Announces Advanced G4 ICARUS Combustion Gas Analyzer for Metal Foundry and Heat Treatment Applications
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Glass and Coatings
Certainly glass is one of the most important and fascinating material since ancient times, although in a physical sense the description ‘glass’ might be misleading. Nowadays the description ‘glass’ is more commonly used as a synonym for a state of aggregation between fluid and solid. But this particular property of glass makes it a universal material which can be used for countless applications.
Elemental Analysis in Glass Production by X-ray Fluorescence Spectrometry (XRF)
- S8 TIGER
In order to meet the requirements of its later use different types of material are mixed or dissolved in the raw glass. This process can be monitored by X-ray fluorescence analysis (XRF). The plug ‘n analyze wavelength dispersive spectrometer (WDXRF) S8 TIGER 1K is performing the determination of the elemental composition qualitatively or quantitative with high precision. The perfect analytical solution, if installation requirements and low running costs are in main focus.
High sample throughput in combination with accurate and precise determination of light elements like Boron or elements even at trace levels is the strength of the world class wavelength dispersive X-ray fluorescence spectrometer S4 PIONEER. No matter if Boron needs to be determined with highest precision or Iron must be specified at lowest trace levels in heat insulation glass pane. In particular the reliable verification of the content of heavy metals is an important topic, because the compliance to legally defined maximum permissible values for glass packaging of foodstuff needs to be documented.
X-ray Tools for Phase Analysis in Glass (XRD)
Exactly the fundamental property of the ‘glassy state’ anticipates that traditional X-ray diffraction (XRD) provides sensible structure information – glass does not have a long-range order as present in crystalline material. But µ-XRD with the D8 DISCOVER with GADDS can help to characterize spurious inclusions found in glass because they are typically formed by crystalline material.
X-ray Tools for Multilayer and Thin Film Applications (XRF & XRD)
- D8 ADVANCE with DAVINCI design
Frequently raw glass as well as metal is coated for various reasons. The coating might be anticorrosive, harden the surface, may reflect thermal radiation or any other type of light, or simply ennoble the underlying material. Gracing incidence X-ray diffraction (GID) with the D8 ADVANCE helps to determine unambiguously the crystalline composition of the coating and the thickness. Alternatively XRF can be used to determine the layer thickness as well as the elemental composition.
In case the thickness of the layer or the layer stacks are in the range of some Angstroem up to some hundred Nanometer X-ray reflectometry (XRR) with the D8 DISCOVER is the method to study thicknesses, densities, or roughness completely without standards. To meet these parameters with an accuracy of some percent ensures that the coatings behave as expected, or simply avoids to waste expensive coating material.
